Back to Results
First PageMeta Content
Wavelet / Reflectivity / Scientific method / X-ray reflectivity / Science / Mexican hat wavelet / Mathematical analysis / Functional analysis / Numerical analysis


Surface and Interface 16A1/2002S2003 Analysis of X-ray reflectivity from sputtered carbon thin films (2) Wavelet transform analysis
Add to Reading List

Document Date: 2010-01-05 10:30:34


Open Document

File Size: 72,34 KB

Share Result on Facebook
UPDATE