![](https://www.pdfsearch.io/img/c230f2f85f00e900282cf01518f3ed32.jpg) Date: 2009-07-17 04:50:30
| | F. Pérez-Willard, D. Wolde-Giorgis, Talaát al-Kassab, G. Alejandro-López, R. Kirchheim, D. Gerthsen Fabrication of atom probe specimens containing well-defined grain boundaries with a FIB/SEM system Micron 39, Add to Reading ListSource URL: www.lem.kit.eduDownload Document from Source Website File Size: 17,20 KBShare Document on Facebook
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