![Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan](https://www.pdfsearch.io/img/bce56b6843140b5999f9d8156527d271.jpg) Date: 2015-01-10 06:34:49Integrated circuits Automatic test pattern generation Linear-feedback shift register Built-in self-test Scan chain Hardware Trojan | | Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, AndrapradeshAdd to Reading ListSource URL: www.ijmetmr.comDownload Document from Source Website File Size: 581,93 KBShare Document on Facebook
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