Prentice-Hall / LSI / McGraw-Hill / D S A / John Wiley & Sons / /
Country
Taiwan / Columbia / / /
Event
Product Issues / /
Facility
Bradley University / University of Missouri-Columbia / Chaoyang University of Technology / USA College of Business / Cornell Hall / /
IndustryTerm
passive component chips / rule-based computing approach / multivariate processing / local image processing / Average processing time / inspection device / back-propagation algorithm / neural networks / high speed processing / wavelet-based back-propagation network / carrier plate / manufacturing process / image capturing device / energy function / neural network / vision systems / computer vision systems / industrial vision systems / back-propagation neural network / back-propagation network algorithm / metal oxide semiconductor / applied ant colony algorithm / manufacturing / backpropagation algorithm / back-propagation network / /
MarketIndex
RMSE / /
Organization
Cornell / Department of Industrial Engineering and Management / Department of Industrial and Manufacturing Engineering / University of Missouri / Chaoyang University of Technology / Bradley University / USA College of Business / IEEE Trans Pattern Analysis & Machine Intelligence / /
Position
methods and professional inspector / judge / *Author / /
Product
Pentax K-x Digital Camera / regions / /
ProgrammingLanguage
C / E / J / /
ProvinceOrState
Illinois / New York / Missouri / /
Technology
semiconductor / LED chip / applied ant colony algorithm / back-propagation algorithm / real LED chips / machine learning / back-propagation network algorithm / image processing / process control / t -1 / semiconductors / passive component chips / Machine Vision / neural network / backpropagation algorithm / LED chips / neighboring chips / /
Journal of Scientific & Industrial Research 412 Vol. 67, June 2008, pp[removed]J SCI IND RES VOL 67 JUNE 2008