Engineering Laboratory / Dexter / Clark-MXR Inc. / /
Facility
Rice Quantum Institute / Tokyo Institute of Technology / Rice University / /
IndustryTerm
domain wall energy / electronic devices / carrier-induced ferromagnetism / increased carrier density / ultrashort carrier lifetime / electronic and optoelectronic devices / carrier-mediated ferromagnetism / carrier-induced nature / /
Organization
Department of Electrical and Computer Engineering / Rice University / Houston / Centre for Nanoscale Science and Technology / Optical Society of America OCIS / Tokyo Institute of Technology / Rice Quantum Institute / /
Ultrafast photoinduced softening in a ferromagnetic semiconductor J. Wang, G. A. Khodaparast, J. Kono, Department of Electrical and Computer Engineering, Rice Quantum Institute, and Centre for Nanoscale Science and Techn