![Electronic engineering / Embedded systems / IEEE standards / Joint Test Action Group / Boundary scan / Debugger / Field-programmable gate array / Electrical connector / Atmel AVR / Electronics manufacturing / Manufacturing / Electronics Electronic engineering / Embedded systems / IEEE standards / Joint Test Action Group / Boundary scan / Debugger / Field-programmable gate array / Electrical connector / Atmel AVR / Electronics manufacturing / Manufacturing / Electronics](https://www.pdfsearch.io/img/801ed5acdefea8d88816b94f63a3f01d.jpg)
| Document Date: 2014-01-08 03:14:22 Open Document File Size: 231,97 KBShare Result on Facebook
Currency USD / / IndustryTerm fine-pitch devices / download tools / test systems / / Person Haliplex / Anthony Merry / / Position Chief Technical Officer / / Technology Plug and play / JTAG / / URL www.xjtag.com / /
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