<--- Back to Details
First PageDocument Content
Flash file systems / Non-volatile memory / Embedded Linux / UBIFS / Flash memory / Wear leveling / Solid-state drive / Memory Technology Device / Disk formatting / Computer memory / Computer hardware / Computing
Date: 2014-12-01 09:23:10
Flash file systems
Non-volatile memory
Embedded Linux
UBIFS
Flash memory
Wear leveling
Solid-state drive
Memory Technology Device
Disk formatting
Computer memory
Computer hardware
Computing

Formal Specification of an Erase Block Management Layer for Flash Memory J¨ org Pf¨ ahler, Gidon Ernst, Gerhard Schellhorn, Dominik Haneberg, and Wolfgang Reif

Add to Reading List

Source URL: www.isse.uni-augsburg.de

Download Document from Source Website

File Size: 362,96 KB

Share Document on Facebook

Similar Documents

Future Technology Devices International Ltd.  Application Note AN_105 FTDI Device EEPROM Programming Using a Vinculum VNC1L Document Reference No.: FT_000078

Future Technology Devices International Ltd. Application Note AN_105 FTDI Device EEPROM Programming Using a Vinculum VNC1L Document Reference No.: FT_000078

DocID: 1mZrg - View Document

RouterBOARD 450 The rb450 is a five port ethernet router. The rb450 is replacing rb150, but introduces at least three times better thoughput. The heart of this device is the new Atheros CPU which makes this tiny device a

RouterBOARD 450 The rb450 is a five port ethernet router. The rb450 is replacing rb150, but introduces at least three times better thoughput. The heart of this device is the new Atheros CPU which makes this tiny device a

DocID: 1g4qF - View Document

Mobile USB memory with Remote Data Kill . . Even when not connected to a laptop or the Internet Security Guardian is a small USB memory device which encrypts and tracks your mobile data. Packed with the latest technology

Mobile USB memory with Remote Data Kill . . Even when not connected to a laptop or the Internet Security Guardian is a small USB memory device which encrypts and tracks your mobile data. Packed with the latest technology

DocID: 1dWNE - View Document

Reliable testing of Cu pillar technology for smart devices By Amer Cassier, Lily Zhao, Ahmer Syed, Steve Bezuk, William Miller [Qualcomm] and Amy Leong, Mike Slessor [FormFactor Inc.] T

Reliable testing of Cu pillar technology for smart devices By Amer Cassier, Lily Zhao, Ahmer Syed, Steve Bezuk, William Miller [Qualcomm] and Amy Leong, Mike Slessor [FormFactor Inc.] T

DocID: 1a6K9 - View Document

Microsoft Word - 2_21_Hidemi_Ishiuchi_ABSTRACT_BIO.docx

Microsoft Word - 2_21_Hidemi_Ishiuchi_ABSTRACT_BIO.docx

DocID: 18qBt - View Document