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SISPAD 2012, September 5-7, 2012, Denver, CO, USA RTS Amplitude Distribution in 20nm SOI FinFETs subject to Statistical Variability Xingsheng Wang1*, Andrew R. Brown2, Binjie Cheng1, Asen Asenov1,2 Device Modelling Grou
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Document Date: 2013-02-12 08:39:14
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SISPAD 2012, September 5-7, 2012, Denver, CO, USA RTS Amplitude Distribution in 20nm SOI FinFETs subject to Statistical Variability Xingsheng Wang1*, Andrew R. Brown2, Binjie Cheng1, Asen Asenov1,2 Device Modelling Grou