A simple system for measuring small phase retardation of an optical thin film T.N. Hansen*a, H. Fabriciusa DELTA Light - Hørsholm - Document - PDFSEARCH.IO

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$Electromagnetic radiation / Polarization / Glass physics / Thin-film optics / Polarimetry / Prism / Refractive index / Optical coating / Polarizer / Optical devices / Optics / Physics$	A simple system for measuring small phase retardation of an optical thin film T.N. Hansen*a, H. Fabriciusa DELTA Light & Optics, Venlighedsvej 4, 2970-Hørsholm, Denmark a Add to Reading List Document Date: 2014-09-02 08:47:34 Open Document File Size: 1,05 MB Share Result on Facebook City New York / / Company Schott AG / Marcel Dekker Inc / Optical Thin Films / Thin Solid Films / Suzuki / Ferlauto A.S. / Corning / / Country Germany / Denmark / / Currency USD / / / Event Bankruptcy / / Facility SPIE Digital Library / / IndustryTerm design software / process equipment / thin-film design software / synthesized using proprietary thin-film design software / / Person Norbert Kaiser / H. Angus Macleod Proc / Michel Lequime / / / Product Ion / / ProvinceOrState New York / / Technology laser / dielectric / / URL http / SocialTag Electromagnetic radiation Polarization Glass physics Thin-film optics Polarimetry Prism Refractive index Optical coating Polarizer Optical devices

A simple system for measuring small phase retardation of an optical thin film T.N. Hansen*a, H. Fabriciusa DELTA Light & Optics, Venlighedsvej 4, 2970-Hørsholm, Denmark aAdd to Reading List