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Integrated circuits / Semiconductor devices / Threshold voltage / Charge-coupled device / Depletion region / Diode / CMOS / Transistor / Self-aligned gate / Electronic engineering / Electrical engineering / Electronics
Date: 2006-08-07 12:54:04
Integrated circuits
Semiconductor devices
Threshold voltage
Charge-coupled device
Depletion region
Diode
CMOS
Transistor
Self-aligned gate
Electronic engineering
Electrical engineering
Electronics

High-voltage-compatible, fully depleted CCDs S.E. Holland, C.J. Bebek, K.S. Dawson, J.H. Emes, M.H. Fabricius, J.A. Fairfield, D.E. Groom, A. Karcher, W.F. Kolbe, N.P. Palaio, N.A. Roe, and G. Wang Lawrence Berkeley Nati

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