<--- Back to Details
First PageDocument Content
Keystream / HC-256 / Correlation attack / VEST / Differential cryptanalysis / Linear feedback shift register / Grain / KFB mode / Cryptography / Stream ciphers / RC4
Date: 2004-04-15 08:58:04
Keystream
HC-256
Correlation attack
VEST
Differential cryptanalysis
Linear feedback shift register
Grain
KFB mode
Cryptography
Stream ciphers
RC4

Add to Reading List

Source URL: eprint.iacr.org

Download Document from Source Website

File Size: 221,12 KB

Share Document on Facebook

Similar Documents

Binary arithmetic / Finite fields / Computing / Mathematics / Data transmission / Error detection and correction / Cryptography / Cyclic redundancy checks / Linear-feedback shift register / Parity bit / Cksum / Polynomial code

ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International Journal

DocID: 1qvWR - View Document

Cryptography / Pseudorandom number generators / Stream ciphers / Feedback with Carry Shift Registers / Shrinking generator / Self-shrinking generator / Linear-feedback shift register / P-adic number / VEST

Microsoft Word - IBSS&K Engineering.doc

DocID: 1qpK0 - View Document

Pseudorandom number generators / Cryptography / Theoretical computer science / Applied mathematics / Random number generation / Mersenne Twister / Pseudorandomness / Algorithm / Data Encryption Standard / Linear-feedback shift register / Reconfigurable computing / TestU01

Design & Implementation of Well-Method for Embedded Generation of LPR Numbers Venkateshwarlu Purumala M.Tech, VLSI & Embedded Systems DVR College of Engineering and Technology,

DocID: 1q4Bj - View Document

Electronic design automation / Asset Health Management / Built-in self-test / Test equipment / Electronic design / Linear-feedback shift register / Digital electronics / Test vector

ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International Journal

DocID: 1pvKr - View Document

Integrated circuits / Automatic test pattern generation / Linear-feedback shift register / Built-in self-test / Scan chain / Hardware Trojan

Low Power MSIC Signatures for Effective BIST Design Chekka Narasimha Rao M.Tech Student, Audi Sankara Institute of Technology, NH-5 Bypass Road, East Gudur Rural, Andrapradesh

DocID: 1oOsm - View Document