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Date: 2017-05-19 10:34:01 | Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs Abstract—The efficiency and cost of silicon PUF-based applications, and in particular key generators, are heavily impacted by the levelAdd to Reading ListSource URL: boriskennes.wpengine.comDownload Document from Source WebsiteFile Size: 294,43 KBShare Document on Facebook |