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 Date: 2010-12-27 22:22:07Atomic layer deposition Semiconductor Hafnium(IV) silicate Chemistry Electromagnetism Physics Electronic engineering High-k dielectric Transistors |
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| First Page | Document Content | |
|---|---|---|
Date: 2010-12-27 22:22:07Atomic layer deposition Semiconductor Hafnium(IV) silicate Chemistry Electromagnetism Physics Electronic engineering High-k dielectric Transistors |
Add to Reading List |
Photon Factory Activity Report 2009 #27 Part BSurface and Interface 2C/2008S2003 Relationship between band alignment and chemical states upon annealing in