| Document Date: 2007-02-17 12:35:11
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Company Intel Corporation / John Wiley & Sons / / Facility Aging-Related Hard Failure Rates Brian Greskamp Smruti R. Sarangi Josep Torrellas University of Illinois / / IndustryTerm 65nm processor / technology scaling / highperformance 65nm processor / technology scales / 50mm2 processor chip / reconfigurable devices / series-failure systems / metal atoms / otherwise nominal chip / analytic solution / / Organization Univ. of Illinois / University of Illinois / SESC / Univ. of Virginia / / Person D. Brooks / V / / ProvinceOrState Illinois / Virginia / / PublishedMedium Semiconductor Science and Technology / / Technology semiconductor / otherwise nominal chip / ethernet / 50mm2 processor chip / heat transfer / simulation / 65nm processor / highperformance 65nm processor / Dielectric / / URL http /
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Threshold Voltage Variation Effects on Aging-Related Hard Failure Rates Brian Greskamp Smruti R. Sarangi Josep Torrellas University of Illinois at Urbana-Champaign http://iacoma.cs.uiuc.edu