Proceedings of the 2010 5th IEEE International Conference on Nano Micro Engineered and Molecular Systems January 20-23, Xiamen, China Stiction of Parylene C to Silicon Surface Measured using Blister Tests - Heracleum - Document - PDFSEARCH.IO

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Date: 2017-03-21 04:13:56		Proceedings of the 2010 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems January 20-23, Xiamen, China Stiction of Parylene C to Silicon Surface Measured using Blister Tests Add to Reading List Source URL: brianyu.org Download Document from Source Website File Size: 1.023,16 KB Share Document on Facebook