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Scanning probe microscopy / Electrical phenomena / Materials science / Piezoresponse force microscopy / Piezoelectricity / Ferroelectricity / Reflection high-energy electron diffraction / Atomic force microscopy / Epitaxy / Physics / Electromagnetism / Condensed matter physics


APPLIED PHYSICS LETTERS 86, 192907 共2005兲 Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy Il-Doo Kim, Ytshak Avrahami, and Harry L. Tuller Department o
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Document Date: 2006-10-31 04:02:22


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Pasadena / Cambridge / /

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Arrowhead Research Corporation / A. Atwater Thomas J. Watson Laboratories / A. L. Roytburd S. P. / H. Tokumoto S. A. / /

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American Institute of Physics Downloaded / Massachusetts Institute of Technology / California Institute of Technology / American Institute of Physics / /

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actuator applications / high electron energy diffraction / reflection high energy electron diffraction measurements / /

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LSCO / /

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Army Research Office / California Institute of Technology / American Institute of Physics Downloaded / American Institute of Physics / Massachusetts Institute of Technology / Il-Doo Kim / Ytshak Avrahami / and Harry L. Tuller Department of Materials Science and Engineering / /

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Matthew J. Dicken / Harry L. Tuller / /

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F18 / /

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California / Massachusetts / /

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APPLIED PHYSICS LETTERS / /

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laser / x-ray / fiber optic / dielectric / /

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