High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA (a)

First Page		Document Content
Date: 2015-02-26 01:00:01 Chemistry Intermolecular forces Atomic force microscopy Ficus Microscopy Spectroscopy Vibrational analysis with scanning probe microscopy Scanning probe microscopy Scientific method Science		High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA (a) Add to Reading List Source URL: www.ntmdt.ru Download Document from Source Website File Size: 1,27 MB Share Document on Facebook

	UPB - INVESTIGACIÓN & DESARROLLO No 13, Vol. 1 : 56 – MICROSTRUCTURAL CHARACTERIZATION MIXTURES BY ATOMIC FORCE MICROSCOPY OF DocID: 1ugz1 - View Document
	Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al DocID: 1rmSQ - View Document
	Methods–178 Contents lists available at SciVerse ScienceDirect Methods journal homepage: www.elsevier.com/locate/ymeth DocID: 1rhji - View Document
	NANOSCOPY APPLICATION NOTE M05 Scanning Probe Microscopes for extreme Environments DocID: 1r6wn - View Document
	Journal of Photochemistry and Photobiology A: Chemistry–154 Nanopatterning with conformable phase masks Joana Maria a , Seokwoo Jeon a , John A. Rogers a,b,∗ a DocID: 1r33C - View Document