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Statistics / Reliability engineering / Knowledge / Engineering statistics / Design for X / Failure rate / Reliability / Highly accelerated stress test / Survival analysis / Failure / Systems engineering


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Document Date: 2011-06-08 19:46:45


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File Size: 55,89 KB

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Networks Nihal Sinnadurai Email / BT Laboratories / Photonics Systems / /

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Facility

Building Block / Building Block Method / /

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test systems / fault-tolerant networks / electronics / recovery systems / product technology / broadband networks / manufactured products / qualified products / extra devices / activation energy / telecommunications industry / /

Organization

IEEE Reliability Society / Failure unIT / /

Person

Lot Tolerance / Nihal Sinnadurai / /

Technology

broadband / product technology / network routers / specific technology / hotodiode Chip / /

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