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Condensed matter physics / Scientific method / Electron / Vacuum / Physics / Scanning probe microscopy / Magnetic force microscope


International Magnetics Conference (INTERMAG[removed]April 4-8, 2005, Nagoya Congerss Center Applications of High-Resolution MFM System with Low
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Document Date: 2013-01-14 21:43:04

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City

Tokyo / Chiba / Yokohama / /

Company

SII NanoTechnology Inc. / Ge / Fuji Electric Ltd. / Amp / Keio / /

Country

Japan / /

Facility

Akita University / stable QQ / stable Q Conventional Probe Low Moment Probe NonNon / Tokyo University of Agriculture / /

IndustryTerm

manufacturing / /

Organization

University of Agriculture / Akita University / /

Person

Ishio Lab / Sato / Nakatani / /

Technology

Laser / lithography / simulation / /

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