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Ian Wark Research Institute B: Book chapter Hayes, R. & Ralston, J[removed]), Application of atomic force microscopy in fundamental adhesion studies, in Adhesion promotion techniques, (K Mittal and A Pizzi Ed.), New York
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Document Date: 2011-11-22 21:50:48
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Ian Wark Research Institute B: Book chapter Hayes, R. & Ralston, J[removed]), Application of atomic force microscopy in fundamental adhesion studies, in Adhesion promotion techniques, (K Mittal and A Pizzi Ed.), New York