<--- Back to Details
| First Page | Document Content | |
|---|---|---|
 Date: 2015-07-18 01:30:09Electronic engineering Electromagnetism Semiconductor devices Electrical engineering Coupon Electromigration Reliability Dialog Semiconductor Integrated circuit Semiconductor device fabrication |
Add to Reading List |
Ridgetop Group, IncWest Ina Road Tucson, AZPhone: +Fax: +www.RidgetopGroup.com | Rapid reversible electromigration of intercalated K ions within individual MoO3 nanobundle Zhibin Hu, Chenggang Zhou, Rajiv Ramanujam Prabhakar, Sharon Xiaodai Lim, Yinghui Wang et al. Citation: J. Appl. Phys. 113, 02431DocID: 1uJSZ - View Document |
| Subscriber access provided by - Access paid by the | UC Irvine Libraries Letter Reconnectable Sub-5 nm Nanogaps in Ultralong Gold Nanowires Chengxiang Xiang, Jung Yun Kim, and Reginald M. PennerDocID: 1qN4d - View Document |
| Microsoft Word - In-situ Sensors[1].docDocID: 1qp7t - View Document |
| Ridgetop Group, IncWest Ina Road Tucson, AZPhone: +Fax: +www.RidgetopGroup.comDocID: 1pPks - View Document |
| PROCHEK PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O NDocID: 1pj1S - View Document |