![Electronic design / Chenming Hu / Phil Kaufman Award / BSIM / Multigate device / Transistor model / IEEE Council on Electronic Design Automation / Design Automation Conference / Design Automation and Test in Europe / Electronic engineering / Electrical engineering / Electronic design automation Electronic design / Chenming Hu / Phil Kaufman Award / BSIM / Multigate device / Transistor model / IEEE Council on Electronic Design Automation / Design Automation Conference / Design Automation and Test in Europe / Electronic engineering / Electrical engineering / Electronic design automation](https://www.pdfsearch.io/img/778812e7884051adaa5a863664b03a2e.jpg) Date: 2013-04-30 04:12:39Electronic design Chenming Hu Phil Kaufman Award BSIM Multigate device Transistor model IEEE Council on Electronic Design Automation Design Automation Conference Design Automation and Test in Europe Electronic engineering Electrical engineering Electronic design automation | | NEWS RELEASE For more information, contact: Kristin Steen Public Relations for the IEEE Council on EDA[removed]
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