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RF MEMS / Semiconductor devices / Microelectromechanical systems / Capacitor / Gate oxide / IEEE Kiyo Tomiyasu Award / Materials science / Technology / Electromagnetism
RF MEMS
Semiconductor devices
Microelectromechanical systems
Capacitor
Gate oxide
IEEE Kiyo Tomiyasu Award
Materials science
Technology
Electromagnetism

PRISM Seminar Series – Spring 2009 Modeling of Dielectric Charging in RF MEMS Prof. Ashraf Alam Purdue University School of  Electrical and Computer Engineering

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