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Electrical engineering / Electromagnetism / Electronic engineering / Integrated circuits / Semiconductor devices / Logic families / CMOS / Electronic design / Hot-carrier injection / MOSFET / Negative-bias temperature instability / Threshold voltage


Application Note | AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r
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Document Date: 2015-07-18 01:30:09

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File Size: 1,05 MB

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