Iddq testing

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11	Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-02-18 14:15:52 Integrated circuits Automatic test pattern generation Electronics manufacturing Electronic design Test compression Scan chain Iddq testing Joint Test Action Group Synopsys Electronic engineering Electronics Electronic design automation
12	PDF Document Add to Reading List Source URL: www.ttt.com Language: English - Date: 2001-12-04 22:59:10 Electronics Electromagnetism Iddq testing Electronic design Logic families Single stuck line Electronic engineering Digital electronics Integrated circuits