Date: 2012-02-07 15:25:18Electromagnetism IEEE Electron Devices Society International Electron Devices Meeting Institute of Electrical and Electronics Engineers Integrated circuit Laser diode Reliability engineering Hot carrier injection Symposium on VLSI Circuits Semiconductors Electronic engineering Engineering | | E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY OctVol. 10, No. 4Add to Reading ListSource URL: eds.ieee.orgDownload Document from Source Website File Size: 1,60 MBShare Document on Facebook
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