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Electronics / Joint Test Action Group / Boundary scan / Printed circuit board / In-system programming / Automated X-ray inspection / Field-programmable gate array / Functional testing / Digital electronics / Electronics manufacturing / Manufacturing / Electronic engineering
Date: 2007-07-12 12:07:45
Electronics
Joint Test Action Group
Boundary scan
Printed circuit board
In-system programming
Automated X-ray inspection
Field-programmable gate array
Functional testing
Digital electronics
Electronics manufacturing
Manufacturing
Electronic engineering

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