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Technology / Digital-to-analog converter / Spurious-free dynamic range / Signal generator / Differential nonlinearity / Effective number of bits / Integral nonlinearity / Digital signal processing / Electronics / Electromagnetism


Minutes of March 17, 2004 TC-10 Meeting in Boulder, Colorado Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Tom Linnenbrink Bill Boyer
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Document Date: 2004-04-27 12:19:28


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Boston / /

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IBM / Sandia National Laboratories Sandia National Laboratories LTX Corporation / Texas Instruments / DAC / Teradyne / /

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Italy / /

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pence / /

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Employment Change / /

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Teradyne University of Salerno / /

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Sandia National Laboratories LTX Corporation NIST Bechtel Nevada Teradyne University of Salerno / DAC Subcommittee / /

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Blair Fang / Graham Sol Max David / Bill Boyer Bob Graham Sol / Bob Graham Sol Max / Tom Linnenbrink / Steve Tilden / Tom Linnenbrink Bill Boyer Bob / Solomon Max / Sol Max David Bergman Jerry Blair / Bob Graham / Chuck Adams / David Bergman / Pasquale Daponte / Tom Meyer / /

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Manager International Stds Programs and Governance Standards Activities Phone / Jodi Haasz Program Manager International Stds Programs / editor / Recording Secretary / co-chairman of the committee / subcommittee editor / /

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Colorado / /

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