![Electrical engineering / Electromagnetism / Electronic engineering / Integrated circuits / Semiconductor devices / Logic families / CMOS / Electronic design / Hot-carrier injection / MOSFET / Negative-bias temperature instability / Threshold voltage Electrical engineering / Electromagnetism / Electronic engineering / Integrated circuits / Semiconductor devices / Logic families / CMOS / Electronic design / Hot-carrier injection / MOSFET / Negative-bias temperature instability / Threshold voltage](https://www.pdfsearch.io/img/abb468238e7c54033dd961eb9575c237.jpg) Date: 2015-07-18 01:30:09Electrical engineering Electromagnetism Electronic engineering Integrated circuits Semiconductor devices Logic families CMOS Electronic design Hot-carrier injection MOSFET Negative-bias temperature instability Threshold voltage | | Application Note | AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r
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