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 Date: 2015-07-18 01:30:09Electrical engineering Electromagnetism Electronic engineering Integrated circuits Semiconductor devices Logic families CMOS Electronic design Hot-carrier injection MOSFET Negative-bias temperature instability Threshold voltage |
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Application Note | AN111 ProChek Hot Carrier Injection (HCI) Measurements for the ON Semiconductor ONC18 Process Introduction Today’s microelectronic circuits are designed for high performance and long life in a wide r