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IEEE standards / Electronic engineering / Embedded systems / Joint Test Action Group / Boundary scan description language / Intellitech / Boundary scan / IEEE Standards Association / Field-programmable gate array / Electronics manufacturing / Manufacturing / Electronics


IEEE[removed]Silicon Instruments with IEEE 1500 supported by Intellitech testers
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Document Date: 2013-06-17 09:45:55

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File Size: 28,77 KB

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