Photon Factory Activity Report 2010 - Interface Technologies - Document - PDFSEARCH.IO

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	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 3A, 4C/2010G617 Determination of epitaxial graphene thickness by X-ray diffraction Akkawat RUAMMAITREE, Hailong HU, Hitoshi NAKAHARA, Add to Reading List Document Date: 2012-01-30 04:32:47 Open Document File Size: 205,81 KB Share Result on Facebook Currency pence / / / Facility Nagoya University / / IndustryTerm chemical vapor deposition / energy / / Organization Yahachi SAITO Department of Quantum Engineering / Nagoya University / Nagoya / / Technology spectroscopy / ATM / CVD / chemical vapor deposition / X-ray / / SocialTag Materials science Nanomaterials Emerging technologies Graphene Graphite oxide Conductivity of transparency Chemistry Physics Superhard materials

Photon Factory Activity Report 2010 #28 Part BSurface and Interface 3A, 4C/2010G617 Determination of epitaxial graphene thickness by X-ray diffraction Akkawat RUAMMAITREE, Hailong HU, Hitoshi NAKAHARA,Add to Reading List