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International Apparel Federation / Fashion design


PRESS RELEASE October 18th 2010 India winner of IAF International Designer Award 26th IAF World Apparel Convention in Hong Kong ZEIST- The IAF International Designer Award catwalk show in Hong Kong was won by Pankaj & Ni
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Document Date: 2012-04-17 04:21:55


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Company

Just Style / /

Country

Taiwan / Germany / Belgium / Macau / Mexico / Spain / Greece / India / /

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Facility

Amsterdam Fashion Institute / /

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IndustryTerm

apparel chain / manufacturing / apparel products / /

Organization

Amsterdam Fashion Institute / International Apparel Federation / Republicans / /

Person

Angelia Teo / Wei Kang / Anne Schulze / Erik Nep / Nia Jun / Didier Van der Vorst / Leonie Barrie / Ilse Wiegman / Sr. / /

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Position

judged judge / IAF Designer / Deputy Director / designer / Managing Editor / Associate Editor / Harper / Head / IAF International Designer / /

URL

www.messefrankfurt.com.hk / www.iafnet.com / /

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