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Semiconductor device fabrication / Thin film deposition / Physics / Failure / Focused ion beam / Ion beam / Fib / Failure analysis / Electron microscope / Scientific method / Science / Electron microscopy


Focused Ion Beam Technology and Applications to Microelectronics
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Document Date: 2011-07-27 12:12:51


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File Size: 11,57 KB

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City

Burlington / /

Company

Marsha Abramo IBM Systems / IBM Systems / World Wide Analytical Services Laboratory / Technology Group / /

Facility

Trinity College / Institute of Electrical / World Wide Analytical Services Laboratory / /

IndustryTerm

high resolution imaging / failure analysis applications / technology application development / indispensable tools / technology transfer / /

Organization

Institute of Electrical and Electronics Engineers / IEEE Reliability Society / Trinity College / Electron Device Failure Analysis Society / /

Position

Professional Development Chair / Membership VP / Advisory Engineer / senior member / /

ProvinceOrState

Vermont / /

Technology

integrated circuits / dielectric / integrated circuit / /

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