![Ions / Thin film deposition / Mass spectrometry / Ion source / Semiconductor device fabrication / Ion beam / Electron / Ion gun / Static secondary-ion mass spectrometry / Chemistry / Physics / Scientific method Ions / Thin film deposition / Mass spectrometry / Ion source / Semiconductor device fabrication / Ion beam / Electron / Ion gun / Static secondary-ion mass spectrometry / Chemistry / Physics / Scientific method](https://www.pdfsearch.io/img/6805e8729cdec85ef9b3c9e4e6162c76.jpg)
| Document Date: 2015-04-23 17:42:59 Open Document File Size: 162,85 KBShare Result on Facebook
Company Oxford Applied Research Ltd. / Oxford Applied Research USA / / Country United Kingdom / / / Facility sales@oaresearch.co.uk OXFORD APPLIED RESEARCH Crawley Mill / / / IndustryTerm beam energy / ion-beam energy / beam energy 30eV / beam energy dependent / low energy gas ion source / narrow energy / energy / / Person Ion Beam / / / Technology spectroscopy / /
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