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Radiography / Geometrical optics / Optics / Radiology / Optical devices / X-ray optics / X-ray / Vergence / Optical coating / Electromagnetic radiation / Physics / Medicine
Date: 2014-03-18 13:05:38
Radiography
Geometrical optics
Optics
Radiology
Optical devices
X-ray optics
X-ray
Vergence
Optical coating
Electromagnetic radiation
Physics
Medicine

Multilayer Optics for Novel Sources in X-ray Analytics Andreas Kleine, Bernd Hasse, Jürgen Graf, Uwe Heidorn, Steffen Kroth, Frank Hertlein, Jörg Wiesmann, Carsten Michaelsen Incoatec GmbH, Max-Planck-Str. 2, 21502 Gee

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