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Date: 2013-12-23 21:40:00Electron microscopy JEOL Microscopy Scientific instrument Nuclear magnetic resonance Electron microscope Microscope Optical microscope Electron Scientific method Science Physics | 02_日本電子_ロゴAdd to Reading ListSource URL: www.jeol.co.jpDownload Document from Source WebsiteFile Size: 2,00 MBShare Document on Facebook |
Data sheet STXM Multifunctional scanning transmission X-ray microscope for fast spectromicroscopy.DocID: 1vs6L - View Document | |
Tuesday, 3rd September 2013: 7.15pm T HE SCANNING E LECTRON MICROSCOPE. An evening visit to University of Northampton, Institute for Creative LeatherDocID: 1vpCe - View Document | |
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BADIL Occasional Bulletin No. 24 December 2004 Take the Microscope to Both Sides This Bulletin aims to provide a brief overview of issues related to Palestinian Refugee RightsDocID: 1vlFI - View Document |