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Electromagnetism / Electrical engineering / Scanning probe microscopy / Sensors / Electrical phenomena / Atomic-force microscopy / Electronic design / Magnetic resonance force microscopy / Piezoresistive effect / Nanoelectromechanical systems / JohnsonNyquist noise / Mechanical resonance


ARTICLES Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications MO LI, H. X. TANG* AND M. L. ROUKES†
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Document Date: 2007-11-04 15:44:18

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File Size: 584,82 KB

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