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Parametric statistics / Statistical tests / Covariance and correlation / Normal distribution / Johannes Martin Bijvoet / Errors and residuals in statistics / Least squares / Correlation and dependence / Variance / Statistics / Regression analysis / Data analysis


electronic reprint Journal of Applied Crystallography ISSN
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Document Date: 2013-09-26 15:01:22

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File Size: 125,71 KB

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