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Date: 2017-10-20 12:24:18 | Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis Veeresh Taranalli, Hironori Uchikawa and Paul H. Siegel I. INTRODUCTION Channel modeling for NAND flash memories is a developing researAdd to Reading ListSource URL: cmrr.ucsd.eduDownload Document from Source WebsiteFile Size: 850,13 KBShare Document on Facebook |