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Chemistry / Mass spectrometry / Time-of-flight mass spectrometry / Electron affinity / Ion trap / Ion source
Date: 2012-12-26 11:31:52
Chemistry
Mass spectrometry
Time-of-flight mass spectrometry
Electron affinity
Ion trap
Ion source

THE JOURNAL OF CHEMICAL PHYSICS 137, Slow photoelectron velocity-map imaging spectroscopy of cold negative ions Christian Hock, Jongjin B. Kim, Marissa L. Weichman, Tara I. Yacovitch, and Daniel M. Neumark

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