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Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA
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Document Date: 2013-10-09 06:55:25
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File Size: 1,39 MB
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Company
Local Dielectric Studies NT-MDT Development Inc. /
/
IndustryTerm
electronics /
metal layer /
/
Position
researcher /
novel electronic controller /
/
RadioStation
KFM /
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Technology
phase modulation /
amplitude modulation /
frequency modulation /
dielectric /
semiconductors /
simulation /
/
URL
www.ntmdt.com /
www.ntmdt-tips.com /
/
SocialTag
Scientific method
Atomic force microscopy
AFM probe
Microscopy
Measuring instrument
Kelvin probe force microscope
Magnetic force microscope
Scanning probe microscopy
Science
Chemistry