Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M

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Date: 2011-02-11 05:42:59 Scanning probe microscopy Electricity Physical quantities Condensed matter physics Kelvin probe force microscope Electrostatic force microscope Capacitor Atomic force microscopy Relative permittivity Physics Electromagnetism Science		Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force M Add to Reading List Source URL: www.formatex.info Download Document from Source Website File Size: 2,12 MB Share Document on Facebook

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