Oracle / Medical Device Software / MySQL / Boeing / /
Country
United States / /
Currency
USD / /
Event
Product Recall / Product Issues / /
Facility
US National Institute / North Carolina State University / Yu Lei** *National Institute of Standards / University of Texas / Research Triangle Institute / /
IndustryTerm
software system / telephone switching equipment / earliest applications / famous software bugs / bank account / software/hardware / quality software / telecommunications software / e-commerce / software developers / manufacturing automation system / software assurance / average new car / web server application / e-commerce bookstore application / software functions / software systems / reasonable solutions / real-world applications / manufacturing industry / strength software/hardware / software/hardware systems / software bugs / software development budget / ultra-dependable software / software application works / chemical industry / software validation / certain software products / software testing efficiency / inadequate software testing infrastructure / software testing / /
OperatingSystem
Windows Server / XP / Linux / Microsoft Windows / /
Organization
University of Texas at Arlington / US government / US National Institute for Standards and Technology / Mars Pathfinder mission / Yu Lei** *National Institute of Standards & Technology / *National Institute of Standards & Technology / Reliability Society / National Aeronautics and Space Administration / Research Triangle Institute / North Carolina State University / /
Person
Raghu N. Kacker / D.R. Kuhn / V / D. Richard Kuhn / /
Position
representative / /
Product
Data / report / Boeing 777 / /
ProgrammingLanguage
Java / SQL / /
ProvinceOrState
Texas / Maryland / North Carolina / /
Technology
IPv6 protocols / Linux / operating system / operating systems / ISDN / Java / IPv4 / VOIP / PBX / web server / /
This article is part of the Reliability Society 2010 Annual Technical Report Advanced Combinatorial Test Methods for System Reliability D. Richard Kuhn*, Raghu N. Kacker*, Yu Lei** *National Institute of Standards & Tec