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Analog-to-digital converter / Integral nonlinearity / LTX / Differential nonlinearity / Static testing / David / Technology / Nevi\'im / Bible / Digital signal processing / Electronic circuits / Digital-to-analog converter
Date: 2007-11-07 21:08:21
Analog-to-digital converter
Integral nonlinearity
LTX
Differential nonlinearity
Static testing
David
Technology
Nevi\'im
Bible
Digital signal processing
Electronic circuits
Digital-to-analog converter

P1658 Digital to Analog Standard Meeting, October 16, 2007 Hosted by LTX Corporation, Norwood, MA Modified: 7-November-2007 Attendees: Steve Tilden, Texas Instruments (Chair)

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