RHEED Image Analysis on Epitaxial Niobium Thin Films T. Lahlou4, D. Beringer1, C. Clavero 2, J. Vazquez1 and R. A. Lukaszew1,2 C. Reece3, L. Phillips3, X. Zhao3 and A-M. Valente-Feliciano3 1Department 2Department - Lattice constant - Document - PDFSEARCH.IO

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$Semiconductor device fabrication / Thin film deposition / Chemical elements / Refractory metals / Transition metals / Reflection high-energy electron diffraction / Sputter deposition / Lattice constant / Niobium / Physics / Matter / Chemistry$	RHEED Image Analysis on Epitaxial Niobium Thin Films T. Lahlou4, D. Beringer1, C. Clavero 2, J. Vazquez1 and R. A. Lukaszew1,2 C. Reece3, L. Phillips3, X. Zhao3 and A-M. Valente-Feliciano3 1Department 2Department Add to Reading List Document Date: 2011-03-16 13:41:14 Open Document File Size: 3,05 MB Share Result on Facebook City Newport News / Williamsburg / / Company RRR Thin Films / Thin Solid Films / / Facility College of William / Jefferson National Accelerator Facility / / IndustryTerm activation energy / energy electron diffraction formation / / Organization College of William & Mary / / Person George Mason / / ProvinceOrState Virginia / / Technology Image processing / radio frequency / / SocialTag Semiconductor device fabrication Thin film deposition Chemical elements Refractory metals Transition metals Reflection high-energy electron diffraction Sputter deposition Lattice constant Niobium Physics

RHEED Image Analysis on Epitaxial Niobium Thin Films T. Lahlou4, D. Beringer1, C. Clavero 2, J. Vazquez1 and R. A. Lukaszew1,2 C. Reece3, L. Phillips3, X. Zhao3 and A-M. Valente-Feliciano3 1Department 2DepartmentAdd to Reading List