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Microscopes / Electron / Leptons / Spintronics / Nanowire / Transmission electron microscopy / Helium atom scattering / Surface extended X-ray absorption fine structure / Physics / Scientific method / Science


pubs.acs.org/NanoLett Standardless Atom Counting in Scanning Transmission Electron Microscopy James M. LeBeau,*,† Scott D. Findlay,‡ Leslie J. Allen,§ and Susanne Stemmer*,† †
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Document Date: 2010-11-11 01:31:08

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File Size: 2,22 MB

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City

L. A. / Findlay / Clark / Anderson / /

Company

Marks N. A. / Ringer S. P. / Pearson / /

Country

Japan / United States / /

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Facility

Institute of Engineering Innovation / Pearson Prentice Hall / University of Melbourne / The University of Tokyo / University of California / /

IndustryTerm

high-angle annular dark-field imaging / atomic-resolution characterization tool / imaging / energy / /

Organization

American Chemical Society / Institute of Engineering Innovation / University of Melbourne / Victoria / School of Engineering / Materials Department / School of Physics / University of California / Santa Barbara / U.S. National Science Foundation / University of Tokyo / Tokyo / Australian Research Council / U.S. Department of Education / /

Person

Cockayne / Susanne Stemmer / Leslie J. Allen / /

Position

D. J. / /

Product

Titan / /

ProgrammingLanguage

MATLAB / /

ProvinceOrState

South Dakota / South Carolina / British Columbia / California / Victoria / /

Technology

X-ray / spectroscopy / simulation / Image Processing / /

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