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Mathematical analysis / Complex analysis


1 A coincidence-based test for uniformity given very sparsely-sampled discrete data Liam Paninski Department of Statistics, Columbia University
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Document Date: 2008-07-01 17:24:02

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City

Springer / /

Company

Neural Information Processing Systems / Pearson / /

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IndustryTerm

fold product / /

Organization

Columbia University / National Science Foundation / American Statistical Association / Liam Paninski Department of Statistics / Cornell / /

Person

Liam Paninski / Ruyter van Steveninck / /

Position

Statistician / /

ProvinceOrState

New York / /

PublishedMedium

The American Mathematical Monthly / The American Statistician / Journal of the American Statistical Association / Mathematics Magazine / IEEE Transactions on Information Theory / /

URL

www.stat.yale.edu/∼pollard / http /

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