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Electron microscopy / Spectroscopy / Diffraction / Microscopes / Reflection high-energy electron diffraction / Electron microscope / Photoemission electron microscopy / Electron diffraction / Low-energy electron microscopy / Scientific method / Science / Physics


1 Reflection Electron Microscopy and Spectroscopy for
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Document Date: 2004-05-29 13:31:10


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City

Saport / /

Company

UPS / AES / REM / /

IndustryTerm

energy-losses / low-energy electron diffraction / metal / incident electron beam energy / potential applications / high-energy electron diffraction / metal and ceramic surfaces / secondary electron imaging / high-energy loss / surface imaging techniques / chemical composition / reflection electron imaging technique / surface chemical analysis / important applications / microanalysis using energy dispersive x-ray spectroscopy / low-energy electron microscopy / high energy-loss / digital imaging / low-energy-loss / real-space imaging / reflection high-energy electron diffraction / characterization tools / high-energy / chemical / real space imaging / crystal structure using imaging / reflected high-energy electrons / imaging / energy dispersive spectroscopy / surface imaging / electronic and chemical structures / in-situ imaging / surface chemical structures / energy-filtering system / energy / surface profile imaging techniques / /

Person

Lin Wang / /

Technology

semiconductor / x-ray / dielectric / Spectroscopy / digital imaging / /

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