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Literaturverzeichnis [AK94] P. Asoka-Kumar, K.G. Lynn, D.O. Welch. Characterization of defects in Si and SiO2 -Si using positrons. J. Appl. Phys., 76(9):4935 – 4982, AK96] P. Asoka-Kumar, M. Alatalo, V.J. Ghosh,
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Document Date: 1998-11-17 10:20:00
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File Size: 164,73 KB
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