Martijn

Results: 342



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321Modified field enhancement and extinction by plasmonic nanowire dimers due to nonlocal response Giuseppe Toscano,1 Søren Raza,1,2 Antti-Pekka Jauho,3 N. Asger Mortensen,1 and Martijn Wubs1,∗ 1 DTU

Modified field enhancement and extinction by plasmonic nanowire dimers due to nonlocal response Giuseppe Toscano,1 Søren Raza,1,2 Antti-Pekka Jauho,3 N. Asger Mortensen,1 and Martijn Wubs1,∗ 1 DTU

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Source URL: www.martijnwubs.nl

Language: English - Date: 2013-09-19 04:38:07
322© 2013 Science Wise Publishing &  DOI[removed]nanoph[removed]      Nanophotonics 2013; 2(3): 161–166 Regular article Giuseppe Toscano, Søren Raza, Wei Yan, Claus Jeppesen, Sanshui Xiao, Martijn Wubs,

© 2013 Science Wise Publishing & DOI[removed]nanoph[removed]      Nanophotonics 2013; 2(3): 161–166 Regular article Giuseppe Toscano, Søren Raza, Wei Yan, Claus Jeppesen, Sanshui Xiao, Martijn Wubs,

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Source URL: www.martijnwubs.nl

Language: English - Date: 2013-09-19 04:37:03
323Sustainability Criteria & Certification systems for Biomass Production Ir. Martijn Vis BTG Biomass Technology Group BV [removed]

Sustainability Criteria & Certification systems for Biomass Production Ir. Martijn Vis BTG Biomass Technology Group BV [removed]

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Source URL: ec.europa.eu

Language: English - Date: 2008-11-13 13:32:49
324A-junioren1 Bram Aandeweg Joep Baars Mark Besselink Martijn Bisselink Kai van Duppen

A-junioren1 Bram Aandeweg Joep Baars Mark Besselink Martijn Bisselink Kai van Duppen

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Source URL: www.hc-03.nl

Language: Dutch - Date: 2014-06-06 10:40:31
    325The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra  Amsterdam Center for Law & Economics

    The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra Amsterdam Center for Law & Economics

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    Source URL: expecon.gsu.edu

    Language: English - Date: 2009-05-05 12:14:24
    326The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra  Amsterdam Center for Law & Economics

    The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra Amsterdam Center for Law & Economics

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    Source URL: www.excen.gsu.edu

    Language: English - Date: 2009-05-05 12:14:24
    327The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra  Amsterdam Center for Law & Economics

    The Overcharge as a Measure for Antitrust Damages Martijn A. Han, Maarten Pieter Schinkel and Jan Tuinstra Amsterdam Center for Law & Economics

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    Source URL: excen.gsu.edu

    Language: English - Date: 2009-05-05 12:14:24
    328Document  Case 3:04-cv[removed]JAP-JJH 344-3

    Document Case 3:04-cv[removed]JAP-JJH 344-3

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    Source URL: shellnews.net

    Language: English - Date: 2013-02-25 18:11:37
    3295 tips for SME’s for applying to the SME instrument Martijn Lammers 27 mei 2014

    5 tips for SME’s for applying to the SME instrument Martijn Lammers 27 mei 2014

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    Source URL: www.rvo.nl

    Language: English - Date: 2014-06-02 08:45:44
      330Martijn Pluim Director Education Master of Arts in International Relations; University of Amsterdam; Amsterdam, the Netherlands

      Martijn Pluim Director Education Master of Arts in International Relations; University of Amsterdam; Amsterdam, the Netherlands

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      Source URL: www.icmpd.org

      Language: English - Date: 2012-05-03 04:26:45